Hprobe Advances Production Testing for Magnetic Semiconductor Devices

Dec 28, 2021 | Hprobe in the news

MAGNETICSMAG | December 22, 2021

Hprobe, a provider of automatic test equipment for magnetic semiconductor devices, has announced what it says is a breakthrough magnetic test head revolutionizing magnetoresistive random access memory (MRAM) wafer sort in mass production. The new module, the H3DM-XL, is at the heart of the latest addition to the company’s IBEX line, depicted above, the IBEX-WS.