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Hprobe will be exhibiting at IEDM 2019 (December 7-11, 2019 Hilton San Francisco Union Square), in Booth #18 with North American Nanotech, Inc. (NANI)

Nov 25, 2019 | Events

Hprobe will feature the IBEX 200/300 wafer level magnetic tester, with a 3D magnetic generator designed to test Magnetic Tunnel Junctions (MTJ) of Spin Transfer Torque (STT) and Spin-orbit Torque (SOT) Magnetic Random Access Memory (MRAM) devices in under one (1) second.

Hprobe’s 3D magnetic-head delivers unlimited selection magnetic field dynamic vectors with accuracy better than a few tens of a millitesla (mT).