3D magnetic field Wafer-Level Tester


Key Features 

  • High amplitude in-plane and perpendicular magnetic field
  • 3D control of field orientation
  • Rotating field
  • Embedded Calibration sensor
  • Automated test programs
  • Parameters extraction software for MRAM
  • From 100mm up to 300mm wafers
  • Compatible with standard probe cards







The Hprobe tester is the preferred tool for wafer level characterization and testing under magnetic field. It uses a patented 3D magnetic field generator and state of the art, customizable, commercial hardware to bring a full test solution for all magnetic devices, from sensors to MRAM, for R&D and manufacturing. The tool is built on the standard industrial automated wafer prober of your choice. 

  • Example of Test Protocols
  • Magneto-resistance Hysteresis curves
  • Resistance distribution
  • Switching Phase Diagram
  • I-V curve
  • Switching probability 
  • Switching Pulse currents
  • Pulse width dependence
  • Temperature dependence
  • Field Amplitude dependence
  • Field Angle dependence
  • Pulse/Quasi static Diagrams
  • Breakdown Voltage
  • Endurance