SNIA announces the MRAM Alliance SIG, bringing together industry leaders to accelerate adoption, align standards, and support MRAM across applications.
Draw Attention
Hprobe at INTERMAG 2026 in Manchester
Hprobe will be at INTERMAG 2026 in Manchester, showcasing its magnetic test solutions, connecting with industry leaders, and speaking on MRAM technologies.
Hprobe gains traction in China’s semiconductor market
After SEMICON China, Hprobe gains strong media visibility, highlighting growing demand for MRAM and magnetic test solutions.
Hprobe expands China presence for MRAM testing
Hprobe is strengthening its presence in China to support the rapid growth of MRAM and magnetic sensor manufacturing.
We’re heading to SEMICON China
25-27/03/2026 We’re heading to SEMICON China 2026 in Shanghai. Part of Mycronic, Hprobe will be present alongside Quantum Design China supporting the growing momentum of MRAM…
Chip Scale Review: TMR testing at wafer scale
February 25, 2026 In Chip Scale Review, Siamak Salimy explains why TMR is booming—and how 3D wafer-level testing ensures precision and high throughput.
We will be exhibiting at SEMICON Korea
11-13/02/2026 We will be exhibiting at SEMICON Korea: This will be a good opportunity to meet and exchange with partners, customers, and industry …
Hprobe to exhibit at SEMICON Japan
08/12/2025 [EVENT NEWS] Hprobe to exhibit at SEMICON Japan! Hprobe will be present at SEMICON Japan next week, alongside Mycronic Japan on booth…
Join us at IEDM and the MRAM Global Innovation Forum in San …
30/11/25 Join us at IEDM and the MRAM Global Innovation Forum in San Francisco! A full week dedicated to the latest breakthroughs in semiconductor…