News & Events
PRESS RELEASES
Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices
![[세미콘코리아 2022] 반도체 테스터 장비 회사 Hprobe, 국내 영업 본격 시동](https://www.hprobe.com/wp-content/uploads/2022/03/logo5.jpeg.png){kind=logo}
INDUSTRY NEWS
![[Future Semiconductor Technology] The Present of the Next-Generation Ultra-Low-Power MRAM Technology](https://www.hprobe.com/wp-content/uploads/2021/05/logo.png){kind=logo}
