Speed-Up wafer-level Magnetic Test
Hprobe wafer-level tester hasten development and production of magnetic devices with its full features to characterize, control and monitor magnetic films embedded in test structure or patterned devices.
A unique patented technology
Hprobe offers a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. Current product line includes dedicated tools for characterization and testing of MRAM (STT, SOT, VCMA) and Magnetic Sensors (TMR, GMR, etc.) in all phases of the magnetic technology development.
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HPROBE – Booth 36
A Global Presence
The company is headquartered near Grenoble, France, at the heart of the French Silicon Valley. This location strategically positions the company in one of Europe’s key semiconductor research and manufacturing hubs.
We supply our products worldwide through this location, supported by a number of country agents and distributors. If we cover Europe and a couple of other regions still directly from France, we have a worldwide sales network with one agent in the U.S., and one agent and a distributor covering for China, as well as Taiwan and Singapore. As global demand for our products grow, we intend to expand and strengthen our global reach by establishing sales and customer support in other key strategic regions.
Hprobe is supported by :