Speed-Up wafer-level Magnetic Test

Speed-Up Development of Integrated Magnetic Devices

Hprobe wafer-level tester hasten development and production of magnetic devices with its full features to characterize, control and monitor magnetic films embedded in test structure or patterned devices.

Improve Yields of MRAM Manufacturing Process

With Hprobe 3D magnetic generator, high field sweep in the perpendicular direction is applied on the device to evaluate the STT-MRAM using pre-implemented electrical tests. The control of the memory unit cells could be done directly after patterning the magnetic tunnel junction (MTJ) stack.

Enhance Sorting Performances of Magnetic Sensors

On Hprobe wafer tester, the 3D generator provides high rotating field speed with accurate angle and amplitude control. This helps in increasing the wafer throughput during parametric and final testing, and allow to increase the test coverage.

MRAM Test

Magnetic SENSOR Test

A unique patented technology

Hprobe offers a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. Current product line includes dedicated tools for characterization and testing of MRAM (STT, SOT, VCMA) and Magnetic Sensors (TMR, GMR, etc.) in all phases of the magnetic technology development.

Press releases

Hprobe Announces Breakthroughs in MRAM Wafer Testing to Support Production Ramp-up

Grenoble, France, December 1, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...

Laurent Lebrun: A Strong Entrepreneurship Professional With A Vision Of Global Transformation

By CIO Business Review | October 2022 The global corporate sector is undergoing a transformation, and what previously worked is no longer viable....

eBook: 2022 and Beyond for Memory Technology

TechInsights| 2022 DRAM and NAND Flash memory demands have been steadily increasing and Emerging Memory markets such as STT-MRAM, ReRAM, PCRAM,...

16. XMR-Symposium

8. and 9. March 2023 in Wetzlar

XMR-Symposium
Magnetoresistive Sensors
and Magnetic Systems

Hprobe will be exhibiting at the16th XMR Symposium, on March 8-9, 2023 in Wetzlar (Germany).

Hprobe designs, manufactures, and markets equipment for wafer-level testing of magnetic devices – and in particular Magnetic sensors (Hall sensors, XMR sensors), dedicated to industrial and automotive applications.

We will be showcasing our latest technology on our booth during this Symposium

Don’t miss out on the opportunity to discover our cutting-edge solution designed for R&D, but also designed for high-volume manufacturing thanks to the very high throughput achieved by our magnetic testers.

We look forward to seeing you there!

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A Global Presence

The company is headquartered near Grenoble, France, at the heart of the French Silicon Valley. This location strategically positions the company in one of Europe’s key semiconductor research and manufacturing hubs.
We supply our products worldwide through this location, supported by a number of country agents and distributors. If we cover Europe and a couple of other regions still directly from France, we have a worldwide sales network with one agent in the U.S., and one agent and a distributor covering for China, as well as Taiwan and Singapore. As global demand for our products grow, we intend to expand and strengthen our global reach by establishing sales and customer support in other key strategic regions.

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