Speed-Up wafer-level Magnetic Test
A unique patented technology
Hprobe offers a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. Current product line includes dedicated tools for characterization and testing of MRAM (STT, SOT, VCMA) and Magnetic Sensors (TMR, GMR, etc.) in all phases of the magnetic technology development.

Hprobe, Leader in Magnetic Field Testing Creates Subsidiary in Germany and Receives First Order from Fraunhofer IPMS
Grenoble, France, January 26, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...

Hprobe Claims To Have The Primary Turnkey Check Gear For 3D Magnetic Sensors
Radio Technology News Daily Press | Dec 15, 2020 The equipment is based on Hprobe’s 3D magnetic field generator technology for single and...

Spintronic devices: a promising alternative to CMOS devices
Journal of Computational Electronics | 19 January 2021 Abstract The field of spintronics has attracted tremendous attention recently owing to its...
Hprobe will be exhibiting at 2020 INTERMAG (May 4-8, Palais des congrès, Montréal, Canada), in Booth #27 with North American Nanotech, Inc. (NANI)
A Global Presence
The company is headquartered near Grenoble, France, at the heart of the French Silicon Valley. This location strategically positions the company in one of Europe’s key semiconductor research and manufacturing hubs.
We supply our products worldwide through this location, supported by a number of country agents and distributors. If we cover Europe and a couple of other regions still directly from France, we have a worldwide sales network with one agent in the U.S., and one agent and a distributor covering for China, as well as Taiwan and Singapore. As global demand for our products grow, we intend to expand and strengthen our global reach by establishing sales and customer support in other key strategic regions.
