Hprobe offers a 3D magnetic field wafer tester for all types of magnetic devices
Planar and perpendicular Magnetic Tunnel Junction (MTJ)
STT-MRAM - SOT-MRAM
Magnetic MEMS sensors
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Hprobe has developed a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. With our 3D generator technology, each magnetic field spatial axis is driven independently. User can apply and control the magnetic field in any direction of space, as well as generate rotating fields.
3D Magnetic Wafer-Level Tester
The Hprobe equipment is a plug and play 100mm to 300mm automated wafer tester for magnetic devices and sensors.
Our wafer tester is the preferred tool for wafer level characterization and testing under magnetic field. It uses a patented 3D magnetic field generator and state of the art, customizable, commercial hardware to bring a full test solution for all magnetic devices, from sensors to MRAM.
A full software for wafer level testing automation is available which includes the magnetic sources generation, a set of pre-defined tests for electro/magnetic parameter extraction on thin films materials, MRAM and sensors.
6-7-2017 : Hprobe wins 300 K€ at iLab, national French start-up contest
15-5-2017 : Hprobe, la H(igh) Technology in Presences
24 to 28-04-2017 : Hprobe presents their products at INTERMAG in Dublin - Booth n°15
27 to 30-03-2017 : Hprobe had a booth at ICMTS in Grenoble
6-11-2016 : L'essor : http://lessor.fr/hprobe-teste-les-memoires-magnetiques-de-derniere-generation-16774.html