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Hprobe tester requests
Wafer size
300 mm
200 mm
Other
Wafer loading
Automatic
Semi-automatic
Manual
Temperature range
Room
+25°C to 150°C
able to up-date for -55°C to 150°C
-55°C to 150°C
Probe system
2 probes
4 probes
Probe card
Other
Pulse requirement
4 ns to 200 ms
0,3 ns to 200 ms
Other
Magnetic field generator
3D configuration with maximum in vertical (Z)
3D configuration with maximum in planar (XY)
2D planar configuration (XY)
2D vertical and planar configuration (XZ)
1D vertical (Z)
1D planar (X or Y)
Note :
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