SEMICONDUCTOR ENGINEERING | JANUARY 13TH, 2022 Spin-orbit torque memory adds endurance and faster write speeds, but displacing existing memories is...
Hprobe in the news
Latest Emerging Memory Developments At 2021 IEDM And MRAM Fo…
FORBES | Tom Coughlin | Dec 27, 2021, This article covers some more interesting content from the 2021 IEEE IEDM and the MRAM Forum that followed the...
SOT-MRAM Research Overview Challenges and Current Market Tre…
MRAM is rapidly gaining traction as a premier candidate for universal non-volatile storage, offering a compelling alternative to traditional semiconductor memories through its intrinsic non-volatility, low power consumption, and high endurance, positioning it to redefine the future of random-access memory technology.
Breakthrough in high-volume testing for automotive/consumer …
Electronics360| 12 July 2021 Hprobe, a provider of semiconductor automated test equipment for magnetic devices, successfully demonstrated a new 3D...
Accuracy boost for magnetic wafer probe
eeNews Europe | Nick Flaherty | June 22, 2021 The latest magnetic wafer probe design from Hprobe has an accuracy of less than 5µT French test...
可在量產中實現良率管理的STT-MRAM磁性測試
CTIMES | 【作者: Siamak Salimy】/ 2021年06月02日 星期三...






