SEMICON West 2026 is where Hprobe will showcase its latest solutions for magnetic semiconductor testing, with a focus on MRAM and magnetic sensors. Taking place October 13–15 at Moscone Center in San Francisco, the event brings together semiconductor technology leaders from across the industry.
Testing magnetic semiconductor devices comes with a unique challenge: the magnetic field can interfere with the test itself. Hprobe develops dedicated magnetic testing solutions that combine controlled magnetic field generation with electrical testing, helping manufacturers characterize advanced magnetic devices accurately and repeatably at wafer level.
Why Magnetic Testing Matters for Semiconductor Devices
Magnetic devices are becoming increasingly important across the semiconductor industry.
MRAM, or Magnetoresistive Random-Access Memory, is attracting attention as a non-volatile memory technology for applications requiring speed, endurance and data retention. At the same time, magnetic sensors are increasingly used in automotive, industrial, consumer and other advanced applications.
Testing these devices is different from conventional semiconductor testing.
Their behavior depends not only on electrical signals, but also on the strength, direction and dynamics of an applied magnetic field. This creates additional requirements for semiconductor test equipment, particularly when manufacturers need to characterize devices accurately and repeatably at wafer level.
For advanced magnetic devices, simply applying a magnetic field is not enough. The field needs to be precisely controlled, repeatable and synchronized with the electrical test.
This is where Hprobe’s technology is designed to make a difference.
Hprobe’s Magnetic Testing Solutions from R&D to Production
Hprobe develops automated test equipment (ATE) specifically for magnetic semiconductor devices, combining controlled magnetic field generation with electrical testing and wafer-level automation.
Its solutions are designed to help semiconductor manufacturers characterize magnetic devices under controlled conditions, from early-stage research and development through to advanced production environments.
Hprobe’s technology addresses two major areas of magnetic semiconductor testing: MRAM testing and magnetic sensor testing.
MRAM Testing for Advanced Memory Technologies
Hprobe develops magnetic test platforms for different MRAM technologies, including STT-MRAM and SOT-MRAM.
These systems combine controlled magnetic stimulation with electrical measurements, allowing manufacturers and research organizations to study device behavior, switching characteristics and magnetic performance at wafer level.
Hprobe’s IBEX platform combines 3D magnetic field generation, high-speed electrical testing and automation for advanced MRAM characterization.
Discover Hprobe’s MRAM wafer-level test solutions
Testing Magnetic Immunity in MRAM
Another important aspect of MRAM characterization is magnetic immunity.
Magnetic memory devices need to operate reliably in environments where they may be exposed to external magnetic fields. Understanding their behavior under these conditions is therefore an important part of device characterization and qualification.
Hprobe develops dedicated solutions to help researchers and semiconductor manufacturers investigate magnetic immunity in technologies such as STT-MRAM.
Learn about Hprobe’s magnetic immunity testing
Magnetic Sensor Testing at Wafer Level
Magnetic sensors present another demanding test challenge.
Technologies such as TMR (Tunnel Magnetoresistance) and GMR (Giant Magnetoresistance) are increasingly used to detect position, speed, current, angle and orientation.
As sensor performance improves, testing also requires increasingly precise control of the magnetic environment.
Hprobe’s magnetic sensor test solutions are designed to provide controlled magnetic stimulation at wafer level, helping manufacturers characterize sensor performance while maintaining repeatability across devices and wafers.
Hprobe’s H3DM-XLL is designed for advanced TMR sensor characterization, combining 3D magnetic field generation with wafer-level testing capabilities for demanding R&D and production applications.
Discover Hprobe’s magnetic sensor test technology
SEMICON West 2026: Hprobe’s Magnetic Testing Solutions
At SEMICON West 2026, Hprobe will bring this expertise to one of the world’s key semiconductor industry events.
Taking place from October 13–15, 2026, at Moscone Center in San Francisco, the event brings together semiconductor manufacturers, equipment suppliers, researchers and technology companies working across the semiconductor ecosystem.
For Hprobe, the event is an opportunity to discuss a specific but increasingly important part of semiconductor testing: how to test devices whose behavior depends on magnetic fields.
At SEMICON West 2026, visitors can discuss magnetic testing requirements for MRAM, TMR and GMR devices with the Hprobe team.
Visitors to Booth #6672 in the North Hall can discuss applications including:
- MRAM wafer-level testing
- STT-MRAM and SOT-MRAM characterization
- Magnetic immunity testing
- TMR and GMR sensor testing
- 3D magnetic field generation
- Magnetic device characterization
- High-throughput magnetic testing
- R&D and production test solutions
The Hprobe team will also be available to discuss how magnetic test equipment can be integrated into different testing environments and adapted to the requirements of advanced semiconductor devices.
What Makes Magnetic Semiconductor Testing Different?
Traditional semiconductor testing primarily focuses on electrical parameters. Magnetic devices introduce another variable: the magnetic environment in which the device is being tested.
A magnetic test system therefore needs to address several parameters simultaneously, including magnetic field strength, field direction, field uniformity, synchronization with electrical measurements and overall test throughput.
For wafer-level testing, consistent magnetic conditions across the area being tested are particularly important for obtaining meaningful and repeatable measurements.
These requirements make magnetic testing a specialized part of the semiconductor ATE landscape.
Hprobe focuses specifically on the intersection between magnetic field generation, electrical testing and semiconductor automation.
From Laboratory Characterization to Semiconductor Production
Magnetic testing is not limited to early-stage research.
As MRAM and magnetic sensor technologies progress toward industrial manufacturing, test solutions must evolve with them. Equipment that works well for a small number of devices in an R&D environment may not necessarily meet the requirements of high-volume semiconductor manufacturing.
Hprobe designs its solutions with different stages of the device development cycle in mind, from early device research and wafer-level characterization to technology development, device optimization and production test development.
The objective is to provide manufacturers and research organizations with reliable magnetic test capabilities as magnetic technologies move from the laboratory toward commercial production.
For more information about semiconductor manufacturing and industry trends, visit the SEMI website.
Meet Hprobe at SEMICON West 2026
SEMICON West 2026 provides an opportunity to meet the Hprobe team and discuss the specific challenges of magnetic device testing.
Whether you are developing a new MRAM technology, qualifying magnetic sensors, investigating magnetic immunity or looking to improve wafer-level test performance, our team can discuss the requirements of your application.
Visit Hprobe at Booth #6672 in the North Hall, October 13–15, 2026, at Moscone Center in San Francisco.
Hprobe will be represented by Gilles Lambinet, Daniel Montag and Monssef Maklouhf, who will be available to discuss magnetic testing technologies, applications and semiconductor test challenges.
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About Hprobe
Hprobe, a Mycronic company, specializes in automated test equipment for magnetic semiconductor devices, including MRAM and magnetic sensors.
Founded in Grenoble, France, Hprobe originated as a spin-off from SPINTEC, a leading research laboratory in spintronics. The company develops patented magnetic field generator technology for precise and repeatable magnetic testing at wafer level.
Hprobe’s solutions support applications ranging from advanced R&D and device characterization to semiconductor manufacturing, helping customers address the specific challenges associated with magnetic device testing.
Learn more about Hprobe and its magnetic testing technology on the Hprobe website or discover Mycronic’s semiconductor technology solutions.