News & Events
PRESS RELEASES
Hprobe Announces Breakthroughs in MRAM Wafer Testing to Support Production Ramp-up
Leading Magnetic ATE Company Hprobe Expands Presence into Korea with Order from Major Semiconductor Manufacturer and Signs with Woowon for Distribution
Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
HPROBE IN THE NEWS
Hprobe Joins Mycronic to Strengthen Leadership in Magnetic Device Testing
Hprobe rejoint le groupe Mycronic pour accélérer son développement et renforcer son leadership
Mémoires magnétiques : la clôture du projet Atemi apporte des avancées notoires pour l’industrie au niveau des tests
NY CREATES and Hprobe Announce Strategic Collaboration for Advanced Semiconductor Memory Testing
INDUSTRY NEWS
Advancing High-Speed Computing with TSMC
Developing the “Industry’s Most Energy-Efficient” Next-Generation MRAM, Selected as IEDM Highlight Paper
Renesas Develops Embedded MRAM Macro that Achieves over 200MHz Fast Random-Read Access and a 10.4 MB/s Fast Write Throughput for High Performance MCUs
