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Hprobe Announces First Automated Test Equipment Dedicated to 3D Magnetic Sensors for Automotive and Industrial Applications

Oct 2, 2020 | Hprobe in the news

SEMICONDUCTOR DIGEST | Shannon Davis | October 2020

Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the first industry turnkey testing equipment dedicated to 3D magnetic sensors used in both automotive and industrial applications. The equipment is based on Hprobe’ s unique 3D magnetic field generator technology for single and multi-site testing at wafer-level, under magnetic field. Operating with automated wafer probing stations and external electrical testers, it offers significant throughput performances, with high flexibility, and compatibility with end-user existing platforms.

“Our new equipment addresses the crucial step of chip sorting for the new generation of magnetic sensors tested at wafer-level, under high field intensity, and on a large area coverage. It offers fully controllable 3D static and variable magnetic field capability allowing the use of a single platform to test different types of products,” said Siamak Salimy, founder and CTO of Hprobe. “This is key for our customers and a major milestone for the industry as evidenced by orders already received from a number of major sensor manufacturers,” he added.