Hprobe joins with Imec for SOT-MRAM tester development

Mar 29, 2019 | Hprobe in the news

Electronics Weekly | David Manners | March 29, 2019

Hprobe, the two year-old Grenoble provider of wafer test equipment for magnetic devices, has joined with Imec to develop advanced magnetic tester equipment for the next generation of MRAM devices based on the Spin Orbit Torque (SOT) effect.