Oct 12, 2022 | Events

Technical Session 4: Power, Magnets, and Memory

Session Chair: Dr. Alan Ferguson (Oxford Lasers – United Kingdom)

14:00 – 14:30
Space Available Seating

Testing challenges for latest SiC and GaN devices
Elia Petrogalli (SPEA S.p.A. – Italy) 

14:30 – 15:00
Space Available Seating

Wafer Level Magnetic Testing of STT-MRAM for Process Control and Chip Sorting in Volume Manufacturing
Siamak Salimy (Hprobe – France) and Henry Chung (HTSI – Taiwan)  

15:00 – 15:30
Space Available Seating

Next Generation DRAM Temperature Requirements and Impacts to Full Wafer Contactor Probe Card Performance
Myung Jin Lee (FormFactor – USA) and Hyun Ae Lee (Samsung Electronics – Korea)