3D magnetic field Wafer Prober
Fasten your tests and your development
Time spent to test wafers increase chip costs and magnetic devices needs to be tested under magnetic field sweep. We have the unique technology to achieve ultra-competitive testing time for magnetic memory (STT MRAM) and sensor devices (TMR Sensors).
Our product is based on a patented fast sweeping 3D magnetic generator associated with top class control and sensing instruments. Built to test devices fast at high field, it is all set ready to use.
No more test development needed to tests your magnetic devices, we test fast and also fasten your technology development by reducing your test development time.
3D Magnetic Wafer Prober … Flexible
The Hprobe equipment is a plug and play 100 mm to 300 mm automated wafer prober for magnetic devices and sensors. Our wafer prober is the preferred tool for wafer level characterization and testing under magnetic field. It uses a patented 3D magnetic field generator and state of the art, customizable, commercial hardware to bring a full test solution for all magnetic devices, from sensors to STT MRAM. A full software for wafer prober testing automation is available which includes the magnetic sources generation, a set of pre-defined tests for electro/magnetic parameter extraction on thin films materials, STT MRAM and TMR Sensors.
Hprobe has a unique solution to generate 3D high magnetic field for wafer prober.
Our product is the key tool for characterization and testing of STT MRAM and TMR Sensors in all phases of your technology development.
In development, characterize and evaluate your devices using our available test module.
In qualification, build a test sequence for sorting and classification learning.
In production, optimize the test sequence and reduce testing time.
→ High amplitude in-plane and perpendicular magnetic field
→ 3D control of field orientation
→ Rotating field
→ Embedded Calibration sensor
→ Automated test programs
→ Parameters extraction software for STT MRAM
→ From 100 mm up to 300 mm wafers
→ Compatible with standard probe cards
The Hprobe tester is the preferred tool for wafer level characterization and testing under magnetic field.
It uses a patented 3D magnetic field generator and state of the art, customizable, commercial hardware to bring a full test solution for all magnetic devices, from TMR sensors to STT MRAM, for R&D and manufacturing.
The tool is built on the standard industrial automated wafer prober of your choice.
3D Magnetic Field Generator Technology
Hprobe has developed a unique patented technology of multidimensional magnetic field generator for STT MRAM and TMR sensors wafer level characterization and testing.
With our 3D generator technology, each magnetic field spatial axis is driven independently. User can apply and control the magnetic field in any direction of space, as well as generate rotating fields.
Hprobe Magnetic ATE is provided with a calibration kit for user to freely generate any type of 3D magnetic field patterns.
The calibration kit consists of a 3D magnetic sensor placed on an automated system within the prober. All driven from the software for user to evaluate the exact field strength at the DUT position.
Hprobe ATE is using top class state of the art control and sense instruments to provide user a unique and reliable experience.
The instruments could be specified by the user and are controlled by the test program which is built to give all the features for easy installation of new instruments or to upgrade them over time.
Example of Test Protocols
Hysteresis curves for ferromagnetic material
Switching Phase Diagram
Switching Pulse currents
Pulse width dependence
Field Amplitude dependence
Field Angle dependence
Pulse/Quasi static Diagrams