Evaluation Engineering | Oct 2nd, 2020
The ATE system addresses the crucial step of chip sorting for the new generation of magnetic sensors tested at wafer-level, under high field intensity, and on a large area coverage.
Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, presented a turnkey testing equipment dedicated to 3D magnetic sensors used in both automotive and industrial applications. Presented as the first of its kind in the industry, the equipment is based on Hprobe’ s 3D magnetic field generator technology for single and multi-site testing at wafer-level, under magnetic field. Operating with automated wafer probing stations and external electrical testers, it offers significant throughput performances, with high flexibility, and compatibility with end-user existing platforms.
Magnetic sensors are used for various automotive and industrial applications to sense physical parameters using a magnetic field and to transmit an electrical response for further process. To validate products for end applications, it is required to test the magnetic sensors under a magnetic field. The outcome of the measurement is data related to the motion of a part or sensing of a current flowing. The sensors are used to extract positioning, angular, strength, and direction information.
The Hprobe system consists of a test head with a robotized 3D magnetic generator, which includes a field calibration and monitoring system. It is built for interfacing with an already available electrical tester, or can be provided with a full tester as a turnkey solution. It comes with dedicated software for customers to implement their own tests and generate a custom 3D magnetic field pattern. A wide range of field configurations are available.