Semiconductor engineering : week in review: manufacturing, test

Mar 29, 2019 | Hprobe in the news

Semiconductor Engineering | Mark Lapedus | March 29, 2019

Hprobe, a provider of turnkey test equipment, has entered into a new phase of advanced magnetic tester development for MRAM and spin orbit torque (SOT) technologies. Hprobe’s test equipment allows users to test STT-MRAM at the wafer level under a magnetic field and using electrical pulsing. Hprobe is collaborating with IMEC.