HPROBE will be present at SEMICON WEST.
SEMICON WEST – 2021
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Caroline Demoerloose
Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
SOT-MRAM Research Overview Challenges and Current Market Trends
Ingenious e-Brain | Dr. Gaurav Santhalia & Riya Dahiya MRAM is becoming more attractive in the industry because of its promising prospects for...
MRAM technologies: from space applications to unified cache memory ?
EE Web | Sebastien Couet | Septembre 22, 2021 Magneto-resistive random access memory (MRAM) is a non-volatile memory technology that relies on the...
Magnetic sensors-A review and recent technologies
IOPSCIENCE | Mohammed Asadullah Khan | 15 June 2021 Abstract Magnetic field sensors are an integral part of many industrial and biomedical...
Emerging Memories Look to Displace NOR, SRAM
EE/TIMES | Gary Hilson| 08.30.2021 3D Xpoint's growth won't be without challenges Emerging memories are poised for another growth surge. That’s...
Breakthrough in high-volume testing for automotive/consumer advanced 3D magnetic sensors
Electronics360| 12 July 2021 Hprobe, a provider of semiconductor automated test equipment for magnetic devices, successfully demonstrated a new 3D...
Accuracy boost for magnetic wafer probe
eeNews Europe | Nick Flaherty | June 22, 2021 The latest magnetic wafer probe design from Hprobe has an accuracy of less than 5µT French test...
Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors
Grenoble, France, June 15, 2021 – Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the...
可在量產中實現良率管理的STT-MRAM磁性測試
CTIMES | 【作者： Siamak Salimy】/ 2021年06月02日 星期三...
Magnetic Testing for STT-MRAM Enabling Yield Management in Volume Manufacturing
CTIMES | By Siamak Salimy | Jun 02, 2021 Because STT-MRAM (Magnetic Random-Access Memory) is fast, non-volatile, durable, low power and scalable, it...
![[Future Semiconductor Technology] The Present of the Next-Generation Ultra-Low-Power MRAM Technology](https://www.hprobe.com/wp-content/uploads/2021/05/logo.png){kind=logo}
[Future Semiconductor Technology] The Present of the Next-Generation Ultra-Low-Power MRAM Technology
SKhynix NEWSROOM | Dr. Joonyeon Chang | January 14, 2021 With the development of information and communication technology (ICT), the amount of...
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester
SemiconductorDigest | SHANNON DAVIS | April 2021 Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices,...
HPROBE RECEIVES ORDER FROM TIER-1 SEMICONDUCTOR MANUFACTURER FOR WAFER-LEVEL MAGNETIC TESTER
Powerelectronics | Hordon Kim | April 2021 Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices,...
Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices
Grenoble, France, April 27, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced...
대량 생산에서 수율 관리를 가능하게 하는STT-MRAM의 자기 테스트 (Magnetic testing for STT-MRAM enabling yield management in volume manufacturing By Siamak Salimy, Founder and CTO of Hprobe)
Semiconductor Network (Korea) STT-MRAM(Spin Transfer Torque Magnetic Random Access Memory ; 스핀 전달 토크 자기 메모리)은 빠르고 휘발성이 없으며 내구성이 뛰어날 뿐 아니라 저전력의...
MRAM Evolves In Multiple Directions
Semiconductor Engineering| Bryon MOYER | March 11TH, 2021 Magnetoresistive RAM (MRAM) is one of several new non-volatile memory technologies...
VIEWPOINT 2021: Siamak Salimy, CTO/Co-Founder, Hprobe
Semiconductor packaging news | February 12, 2021 Despite initial market uncertainties, the societal changes wrought by the 2020 Covid-19 pandemic...
Hprobe, Leader in Magnetic Field Testing Creates Subsidiary in Germany and Receives First Order from Fraunhofer IPMS
Grenoble, France, January 26, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Spintronic devices: a promising alternative to CMOS devices
Journal of Computational Electronics | 19 January 2021 Abstract The field of spintronics has attracted tremendous attention recently owing to its...